Coincidence imaging System with Electron Optics

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F09%3A00336841" target="_blank" >RIV/68081731:_____/09:00336841 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Coincidence imaging System with Electron Optics
Original language description
Instrumental neutron activation analysis (INAA) is a widely used method for elemental analysis. After the sample is put into a neutron field, where nuclei of interest become activated, these nuclei emit gamma photons with characteristic energies for eachelement. By measuring gamma spectrum of the activated sample one can determine the sample elemental composition with very high precision. In order to find out the spatial distribution of elements, the sample is usually cut into pieces, which are examined individually. Such procedure is time consuming and the spatial resolution is limited by the size of the pieces. This contribution follows up the work where the semiconductor pixel detector Timepix was used for revealing the concentration and distribution of certain elements in a whole sample at once (imaging coincidence INAA) [1]. Photons detected by a standard semiconductor detector were used to trigger the Timepix device which detected the accompanying electrons.
Czech name
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Czech description
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Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
11th International Workshop on Radiation Imaging Detectors
ISBN
978-80-01-04378-3
ISSN
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e-ISSN
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Number of pages
1
Pages from-to
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Publisher name
CTU Press
Place of publication
Praha
Event location
Praha
Event date
Jun 26, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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