Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00340747" target="_blank" >RIV/68081731:_____/10:00340747 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films

Original language description

Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions of total reflected and transmitted electron fluxes. Introductory experiments incorporated examination of ultrathin foils of gold, carbon and graphene flakes. Extremely sensitive thickness contrast obtained at units of eV is demonstrated. The phenomenon of electron transmissivity apparently exceeding 100% owing to the contribution of secondary electrons released near to the exit surface is described and discussed.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/IAA100650902" target="_blank" >IAA100650902: Scanning transmission electron microscopy with very slow electrons</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2010

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Materials Transactions

ISSN

1345-9678

e-ISSN

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Volume of the periodical

51

Issue of the periodical within the volume

2

Country of publishing house

JP - JAPAN

Number of pages

6

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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