Ray tracing, aberration coefficients and intensity distribution

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00350668" target="_blank" >RIV/68081731:_____/10:00350668 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Ray tracing, aberration coefficients and intensity distribution
Original language description
In particle optics paraxial ray tracing (solution of the paraxial trajectory equation) provides the basic imaging properties of an optical system and real ray tracing (solution of the equation of motion with time as the parameter) gives the complete particle paths including all aberrations. While there are methods of computing the aberration coefficients directly, for example by evaluating the aberration integrals, ray tracing can also be used for this purpose.
Czech name
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Czech description
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Project
<a href="/en/project/IAA100650805" target="_blank" >IAA100650805: Misalignment aberrations in electron optical systems</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
ISBN
978-80-254-6842-5
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
Institute of Scientific Instruments AS CR, v.v.i
Place of publication
Brno
Event location
Skalský dvůr
Event date
May 31, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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