Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00352510" target="_blank" >RIV/68081731:_____/10:00352510 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science
Original language description
Progress in materials research is inseparably connected to the development of new analytical methods, which make it possible to examine. The aging hardness the structures of materials at high spatial resolution and sensitivity. A very promising techniquefor study the microstructure of advanced materials is the scanning low energy electron microscopy (SLEEM).
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology
ISBN
978-4-9903248-2-7
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
University of Toyama
Place of publication
Toyama
Event location
Toyama
Event date
Sep 12, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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