Accurate and Easy-to-use Electron Optical Design Program for Microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00353047" target="_blank" >RIV/68081731:_____/10:00353047 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Accurate and Easy-to-use Electron Optical Design Program for Microscopy
Original language description
Finite Element Method (FEM) has become the universal method for computing 2D potentials in rotationally symmetric electrostatic and saturated magnetic lenses, electrostatic multipoles and magnetic deflection coils inside lenses. For all these elements optimum methods for computing the first order FEM equations were derived, fast solution algorithms implemented and an option for accuracy evaluation of lens field added. Determination of the optical properties is complemented with high accuracy ray tracingwhich allows extracting the aberration coefficients of up to the 5th order from the ray-traced results.
Czech name
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Czech description
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Project
<a href="/en/project/IAA100650805" target="_blank" >IAA100650805: Misalignment aberrations in electron optical systems</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 17th IFSM International Microscopy Congress
ISBN
978-85-63273-06-2
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Sociedade Brasileira de Microscopia e Microanilise
Place of publication
Rio de Janeiro
Event location
Rio de Janeiro
Event date
Sep 19, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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