Low energy Scanning Transmission Electron Microscope

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F13%3A00398026" target="_blank" >RIV/68081731:_____/13:00398026 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Low energy Scanning Transmission Electron Microscope

Original language description

This paper describes how to obtain high resolution in a Low Energy Scanning Transmission Electron Microscope (LESTEM) down to units of eV with a spot size of units of nm. The imaging of graphene in the stransmitted signal is shown as one application example.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/TE01020118" target="_blank" >TE01020118: Electron microscopy</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2013

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

19

Issue of the periodical within the volume

S2

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

1236-1237

UT code for WoS article

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EID of the result in the Scopus database

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