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Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00434111" target="_blank" >RIV/68081731:_____/14:00434111 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques

  • Original language description

    Knowledge of the distribution and morphology of the Mg2Si precipitates (i.e. .beta.-phase) in Al-Mg-Si alloys are very important for many practical reasons and the scanning electron microscopy (SEM) technique is widely used for their visualization. Unfortunately, in the standard SEM images these precipitates are barely visible and finding them can be very difficult. Using the cathode lens (CL) mode in the SEM (so called SLEEM) these difficulties have been overcome and a very high contrast between the hexagonal-shaped .beta.-phase and the matrix has been obtained. Moreover, it has been found that the SLEEM images offer the possibility to distinguish between the hexagonal-shaped and the conventional .beta.-phase based on their different brightness, not only on their shape, which can be in some cases difficult or even impossible. Mg2Si precipitates have been also characterized by means of the scanning transmission low energy electron microscopy (STLEEM) method based on the using of a STEM

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/TE01020118" target="_blank" >TE01020118: Electron microscopy</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    18th International Microscopy Congres. Proceedings

  • ISBN

    978-80-260-6720-7

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

  • Publisher name

    Czechoslovak Microscopy Society

  • Place of publication

    Praha

  • Event location

    Praha

  • Event date

    Sep 7, 2014

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article