The Study of Ice Impurities Using the Environmental Scanning Electron Microscopy at Higher Pressures and Temperatures
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00434112" target="_blank" >RIV/68081731:_____/14:00434112 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
The Study of Ice Impurities Using the Environmental Scanning Electron Microscopy at Higher Pressures and Temperatures
Original language description
Natural ice and snow accumulate and concentrate significant amounts of impurities that can be stored or chemically transformed, and eventually released to the environment. The location of impurities and their interactions with the water molecules of icehave not yet been sufficiently clarified. The aim of this work is to observe an uranyl-salt brine layer on the ice surface using a back scattered electron detection and the ice surface morphology using a secondary electron detection under equilibrium conditions in a specimen chamber of environmental scanning electron microscope (ESEM). Our specially modified ESEM AQUASEM II equipped with the YAG:Ce3+ backscattered electron detector, an ionization detector of secondary electrons, a special hydration system and a Peltier cooled stage was used. The pressures between 400-700 Pa, 50% water-vapor saturation, and the temperatures above 250 K were utilized in our experiments. At these conditions, the phenomena of etching and subsequent strippin
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA14-22777S" target="_blank" >GA14-22777S: The study of electron-gas interactions in conditions of pressure gradient of low energy environmental scanning electron microscope.</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
18th International Microscopy Congres. Proceedings
ISBN
978-80-260-6720-7
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Czechoslovak Microscopy Society
Place of publication
Praha
Event location
Praha
Event date
Sep 7, 2014
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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