SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00507183" target="_blank" >RIV/68081731:_____/14:00507183 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1088/1757-899X/55/1/012008" target="_blank" >http://dx.doi.org/10.1088/1757-899X/55/1/012008</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1757-899X/55/1/012008" target="_blank" >10.1088/1757-899X/55/1/012008</a>

Result language
angličtina
Original language name
SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing
Original language description
The demand to produce electrical power with higher efficiency and with lower environmental pollution is leading to the use of new advanced materials in the production of power plant equipment. To understand the processes taking place in parts produced from these materials during their operation under severe conditions (such as high temperature, high stress, and environmental corrosion) requires detailed evaluation of their substructure. It is usually necessary to use transmission electron microscopy (TEM). However, this method is very exacting and time-consuming. So there is an effort to use new scanning electron microscopy techniques instead of TEM. One of them is scanning low energy electron microscopy (SLEEM). This paper deals with an assessment of the possibility to use SLEEM for describing the substructure of creep resistant steel CB2 after long-term creep testing. In the SLEEM images more information is contained about the microstructure of the material in comparison with standard scanning electron microscopy. Study of materials using slow and very slow electrons opens the way to better understanding their microstructures.
Czech name
—
Czech description
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Project
<a href="/en/project/TE01020118" target="_blank" >TE01020118: Electron microscopy</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
EMAS 2013 workshop. 13th Europhean workshop on modern developments and applications in microbeam analysis
ISBN
—
ISSN
1757-8981
e-ISSN
—
Number of pages
10
Pages from-to
012008
Publisher name
IOP
Place of publication
Bristol
Event location
Porto
Event date
May 12, 2013
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000337273400008

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