A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00436864" target="_blank" >RIV/68081731:_____/15:00436864 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.ultramic.2014.09.002" target="_blank" >http://dx.doi.org/10.1016/j.ultramic.2014.09.002</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.ultramic.2014.09.002" target="_blank" >10.1016/j.ultramic.2014.09.002</a>
Alternative languages
Result language
angličtina
Original language name
A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs
Original language description
Scanning Low Energy Electron Microscopy (SLEEM) is an imaging technique which uses low energy electrons while providing a very good image resolution. Reflectivity of very slow electrons in the range 0?30 eV can be correlated with the electronic structureof the material, aiming at the determination of the local crystallographic orientation. Since SLEEM is a 2D imaging method, a suitable algorithm is needed to pre-process the image data depending on the beam energy as the third dimension. The crucial task is to detect grain boundaries in polycrystals and evaluate the image signal in connection to the energy of electron impact. Recent algorithms performing the task for the traditional EBSD method are not suitable as they do not address the side-effects of the SLEEM technique. We propose a method that detects the grain boundaries while correcting for image distortion caused by the variation of cathode lens strength, and for several other issues.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LO1212" target="_blank" >LO1212: ALISI - Centre of advanced diagnostic methods and technologies</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Ultramicroscopy
ISSN
0304-3991
e-ISSN
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Volume of the periodical
148
Issue of the periodical within the volume
JAN 2015
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
5
Pages from-to
52-56
UT code for WoS article
000345973000007
EID of the result in the Scopus database
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