Morphological and Chemical Analysis of Impurities in Ice Using the Environmental Scanning Electron Microscopy and Fluorescence Spectroscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00451413" target="_blank" >RIV/68081731:_____/15:00451413 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Morphological and Chemical Analysis of Impurities in Ice Using the Environmental Scanning Electron Microscopy and Fluorescence Spectroscopy

Original language description

Accumulated and concentrated impurities can be stored in natural ice or snow. They are found to be rejected from the freezing solution to the ice grain boundaries, free ice surfaces or liquid/brine inclusions. Information about compartmentation and phasespeciation in ice is thus essential for the assessment of their fate. The location of impurities and their interactions with the water molecules of ice, still not sufficiently clarified, must be studied at low temperatures because thawing smears the information out. When the impurities keep their location while the surrounding ice sublimes, a 3D morphology of the ice boundaries is revealed. Environmental scanning electron microscopy (ESEM) is one of the few methods allowing direct observation of ice bulk sample with location and compartmentation impurities in dynamically changing conditions of relatively high pressure of gas and stable temperature of cooled sample holder.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA14-22777S" target="_blank" >GA14-22777S: The study of electron-gas interactions in conditions of pressure gradient of low energy environmental scanning electron microscope.</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2015

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

21

Issue of the periodical within the volume

S3

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

1699-1700

UT code for WoS article

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EID of the result in the Scopus database

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