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Noise of Low-Energy Electron Beam

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00464578" target="_blank" >RIV/68081731:_____/15:00464578 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216305:26220/15:PU119935

  • Result on the web

    <a href="http://dx.doi.org/10.1109/ICNF.2015.7288583" target="_blank" >http://dx.doi.org/10.1109/ICNF.2015.7288583</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ICNF.2015.7288583" target="_blank" >10.1109/ICNF.2015.7288583</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Noise of Low-Energy Electron Beam

  • Original language description

    Noise diagnostics were performed on a tungsten hair-pin cathode operating in a vacuum (3 · 10(-3) Pa). The cathode operates in thermal emission mode at several temperatures based on the level of heating. Several acceleration voltages have been used starting at 5 kV, 10 kV and 20 kV up to 30 kV. There were two modes-with and without electron beam scanning. Both setups were compared from the point of view of the noise spectral density value. Shot noise is about one order below the current noise spectral density of the electron beam. Therefore, in this case the shot noise spectral density can be neglected. Noise spectral density is 1/f type at the frequency band 0.1 to 10 Hz for cathode with thin film of tungsten oxides. For accelerating voltage from 5 to 20 kV noise in the frequency band from 2 to 20 Hz can be described by the g-r noise with noise spectral density proportional to square of a beam current. At accelerating voltage 30 kV a new g-r noise component appears which is related to electric field distribution among anode, condensers, stigmators and objective.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/TE01020118" target="_blank" >TE01020118: Electron microscopy</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2015 International Conference on Noise and Fluctuations (ICNF) (Proceedings IEEE)

  • ISBN

    978-1-4673-8335-6

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Xi’an

  • Event date

    Jun 2, 2015

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000380427600048