Prospective scintillators for low-energy BSE detectors

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465106" target="_blank" >RIV/68081731:_____/16:00465106 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1002/9783527808465.EMC2016.6239" target="_blank" >http://dx.doi.org/10.1002/9783527808465.EMC2016.6239</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/9783527808465.EMC2016.6239" target="_blank" >10.1002/9783527808465.EMC2016.6239</a>

Result language
angličtina
Original language name
Prospective scintillators for low-energy BSE detectors
Original language description
Cerium activated bulk single crystals of yttrium aluminium garnet (YAG:Ce) Cex:Y3-xAl5O12 are widely used as scintillators for the detection of backscattered electrons (BSE). In the electron microscopy research of nanomaterials, biomaterials or semiconductors, low energy (units of keV) electron beam imaging is often necessary. Because BSE detectors are mostly non-accelerating or low-accelerating, electrons with approximately the same energy as primary beam (PB) have to be detected. However, commonly used YAG:Ce single crystal strongly loses its light yield (LY) with the decrease of the PB energy. As possible available alternatives for this application, bulk single crystals of YAlO3:Ce (YAP:Ce) and CRY018 can be predicted. However, similar LY sink can be expected also with these scintillators.nThere are two main reasons, why this occurs. Firstly, slower electrons don’t have enough energy to pass through the relatively thick conductive layer on the scintillator surface. Therefore, thinner conductive layer has to be used. Secondly, commonly available scintillators suffer from structural defects that are created mostly due to surface damage (as a result of its grinding, polishing, purification or contamination) or already during the own bulk single crystal growth.n
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
EMC2016. The 16th European Microscopy Congress. Proceedings
ISBN
9783527808465
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
1160-1161
Publisher name
Wiley
Place of publication
Oxford
Event location
Lyon
Event date
Aug 28, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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