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Characterization of Burnt Clays by X-ray Diffraction Analysis, Chemical Analysis and Environmental Scanning Electron Microscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465200" target="_blank" >RIV/68081731:_____/16:00465200 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1017/S1431927616010151" target="_blank" >http://dx.doi.org/10.1017/S1431927616010151</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1017/S1431927616010151" target="_blank" >10.1017/S1431927616010151</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Characterization of Burnt Clays by X-ray Diffraction Analysis, Chemical Analysis and Environmental Scanning Electron Microscopy

  • Original language description

    The article deals with the characterization of burnt clays (brick dust and bentonite) by determination of pozzolanic activity and content of amorphous phase. The presence of amorphous state in burnt clays was for the first time monitored by environmental scanning electron microscope. The amorphous phase of burnt clays can be identified only on the larger fragments of material. Treatment of the burnt clays into a fine fraction by grinding brick products or targeted milling leads to disruption of the amorphous phase unidentifiable in the fine dust. X-ray diffraction analysis provides information about the presence and quantity of the amorphous phase, environmental scanning electron microscopy provides information on the way distribution and appearance of the amorphous phase.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microscopy and Microanalysis

  • ISSN

    1431-9276

  • e-ISSN

  • Volume of the periodical

    22

  • Issue of the periodical within the volume

    S3

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    2

  • Pages from-to

    1862-1863

  • UT code for WoS article

  • EID of the result in the Scopus database