Study of Plant Waxes Using Low Temperature Method for ESEM
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465203" target="_blank" >RIV/68081731:_____/16:00465203 - isvavai.cz</a>
Alternative codes found
RIV/00216208:11310/16:10337586
Result on the web
<a href="http://dx.doi.org/10.1017/S1431927616006747" target="_blank" >http://dx.doi.org/10.1017/S1431927616006747</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S1431927616006747" target="_blank" >10.1017/S1431927616006747</a>
Alternative languages
Result language
angličtina
Original language name
Study of Plant Waxes Using Low Temperature Method for ESEM
Original language description
A possibility to study biological samples in their native state, or even living organisms, using an environmental scanning electron microscope (ESEM) is of great importance for biologists. Sputter-free, electrically non-conductive and wet biological samples in their living and native state are observed using ESEM under conditions of high pressure water vapors that ranges from units to thousands of Pa in the ESEM specimen chamber. One of unwanted consequences of the electron beam-gas interaction is the electrons scattering that results in beam spot defocusing followed by the decrease of the detected signalto-noise ratio. This can be compensated by the reduction of beam electrons gas path length and scanning speed or by the increasing of the beam energy. The latter two parameters fundamentally enhance radiation damage of sensitive and soft native samples and represent a limiting factor for their observation using ESEM. This problem can be overcome by the use of special methods like Low Temperature Method for the ESEM (LTM), ideally in a combination with advanced low noise detectors with very high detection efficiencies.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microscopy and Microanalysis
ISSN
1431-9276
e-ISSN
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Volume of the periodical
22
Issue of the periodical within the volume
S3
Country of publishing house
US - UNITED STATES
Number of pages
2
Pages from-to
1180-1181
UT code for WoS article
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EID of the result in the Scopus database
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