High Resolution Study of Epoxy Resin with Silicon Dioxide Nanoparticles in Sputter Coated and Natural state in ESEM
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465245" target="_blank" >RIV/68081731:_____/16:00465245 - isvavai.cz</a>
Result on the web
<a href="http://onlinelibrary.wiley.com/book/10.1002/9783527808465" target="_blank" >http://onlinelibrary.wiley.com/book/10.1002/9783527808465</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/9783527808465.EMC2016.6759" target="_blank" >10.1002/9783527808465.EMC2016.6759</a>
Alternative languages
Result language
angličtina
Original language name
High Resolution Study of Epoxy Resin with Silicon Dioxide Nanoparticles in Sputter Coated and Natural state in ESEM
Original language description
Properties of nanocomposites such as epoxy resin with nanoparticles or microparticles are intensively studied by many scientists and companies. The studies have shown that the already very good electrical insulation properties of epoxy resin, used for example in protective coats of transformers, can be substantially improved by addition of nanoparticles. Enrichment of epoxy resin with silica nanoparticles increases inner resistance and significantly reduces the dissipation factor. The purpose of this work is to show the results of comparison between sputter coated and sputtered free nanostructures and microstructures of an electrically non-conductive matrix observed by environmental scanning electron microscope.nn
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ED0017%2F01%2F01" target="_blank" >ED0017/01/01: APPLICATION LABORATORIES OF ADVANCED MICROTECHNOLOGIES AND NANOTECHNOLOGIES</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
EMC2016. The 16th European Microscopy Congress. Proceedings
ISBN
9783527808465
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
159-160
Publisher name
Wiley
Place of publication
Oxford
Event location
Lyon
Event date
Aug 28, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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