Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F17%3A00477724" target="_blank" >RIV/68081731:_____/17:00477724 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.mee.2017.04.002" target="_blank" >http://dx.doi.org/10.1016/j.mee.2017.04.002</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.mee.2017.04.002" target="_blank" >10.1016/j.mee.2017.04.002</a>
Alternative languages
Result language
angličtina
Original language name
Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes
Original language description
This paper describes a newly designed set-up which is intended for automated preparation both for STM tips and for ultra-sharp field emission cathodes made of polycrystalline and single crystal tungsten in laboratory conditions. The newly designed set-up incorporates electrochemical etching of a wire in the surface layer of an electrolyte and also the so called drop-off method which consists of two steps and requires more precise wire and current setting. Additionally, the method was extended for polycrystalline wires of tungsten using a special cut-off algorithm, which deals with variable etching speed for various crystallographic orientation of the current grain. Produced tips are examined using scanning low energy electron microscopy as for the surface and by the occurrence of electron field-emission as for the geometry based on the Fowler-Nordheim analysis. STM performance of the produced tip is discussed and examined as well.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20402 - Chemical process engineering
Result continuities
Project
<a href="/en/project/LO1212" target="_blank" >LO1212: ALISI - Centre of advanced diagnostic methods and technologies</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronic Engineering
ISSN
0167-9317
e-ISSN
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Volume of the periodical
173
Issue of the periodical within the volume
APR 5
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
6
Pages from-to
42-47
UT code for WoS article
000401387400007
EID of the result in the Scopus database
2-s2.0-85017322634