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Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F17%3A00477724" target="_blank" >RIV/68081731:_____/17:00477724 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.mee.2017.04.002" target="_blank" >http://dx.doi.org/10.1016/j.mee.2017.04.002</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.mee.2017.04.002" target="_blank" >10.1016/j.mee.2017.04.002</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes

  • Original language description

    This paper describes a newly designed set-up which is intended for automated preparation both for STM tips and for ultra-sharp field emission cathodes made of polycrystalline and single crystal tungsten in laboratory conditions. The newly designed set-up incorporates electrochemical etching of a wire in the surface layer of an electrolyte and also the so called drop-off method which consists of two steps and requires more precise wire and current setting. Additionally, the method was extended for polycrystalline wires of tungsten using a special cut-off algorithm, which deals with variable etching speed for various crystallographic orientation of the current grain. Produced tips are examined using scanning low energy electron microscopy as for the surface and by the occurrence of electron field-emission as for the geometry based on the Fowler-Nordheim analysis. STM performance of the produced tip is discussed and examined as well.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20402 - Chemical process engineering

Result continuities

  • Project

    <a href="/en/project/LO1212" target="_blank" >LO1212: ALISI - Centre of advanced diagnostic methods and technologies</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microelectronic Engineering

  • ISSN

    0167-9317

  • e-ISSN

  • Volume of the periodical

    173

  • Issue of the periodical within the volume

    APR 5

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    6

  • Pages from-to

    42-47

  • UT code for WoS article

    000401387400007

  • EID of the result in the Scopus database

    2-s2.0-85017322634