Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F18%3A00494374" target="_blank" >RIV/68081731:_____/18:00494374 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
Original language description
A link between peaks in secondary electron (SE) spectra and Electron Energy Loss Spectran(EELS) was shown decades ago. Also, materials properties (bulk modulus, band gap)ncorrelate with the bulk plasmon position in EELS, and local modulus maps in carbon fibresnhave been presented. If any features as result of plasmon decay into SE can be identified,nSE spectroscopy combined with hyperspectral imaging could transform the SEM into a toolnfor mapping materials properties with ground-breaking potential for nanotechnology. Tonbecome a reality, we first need to establish SE collection conditions spectra that represent anmaterial reliably. Second, we need to gain a better understanding of the processes involved in the SE emission processes.
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar
ISBN
978-80-87441-23-7
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
68-69
Publisher name
Institute of Scientific Instruments The Czech Academy of Sciences
Place of publication
Brno
Event location
Skalský dvůr
Event date
Jun 4, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000450591400026

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