Trip steel specimen preparation for advanced sem and EBSD

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00536988" target="_blank" >RIV/68081731:_____/20:00536988 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.37904/metal.2020.3513" target="_blank" >http://dx.doi.org/10.37904/metal.2020.3513</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.37904/metal.2020.3513" target="_blank" >10.37904/metal.2020.3513</a>

Result language

angličtina

Original language name

Trip steel specimen preparation for advanced sem and EBSD

Original language description

Modern scanning electron microscopy (SEM) allows observations of specimens with high surface sensitivity. The surface sensitivity is significantly affected by the accelerating voltages. With the development of the scanning electron microscopy, the requirements for the surface quality of samples increase. Metallographic methods originally intended for light microscopy become insufficient. The problem occurs especially with multiphase materials having a fine-grained structure. The investigated TRIP steel consists of a ferritic-bainitic matrix, retained austenite and martensite phases. The sizes of the smallest phases are nanometer units. The volume of residual austenite was determined by X-ray diffraction. The basic preparation of all tested samples involved conventional metallographic grinding and very fine mechanical polishing. One sample was analysed in this state. Other samples were subsequently chemically polished, electropolished and chemical-mechanically polished. The specimens were observed in the SEM using a SE and a BSE detector at low energies immediately after the preparation. An EBSD was performed in the same areas to characterize the retained austenite. Topographical imaging by special AFM, integrated into the SEM, demonstrated that the mechanical polishing results in surface deformation and residual austenite is transformed. All other methods have their specifics and for modern sensitive SEM instruments it is necessary to optimize individual procedures.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

—

OECD FORD branch

20501 - Materials engineering

Project

<a href="/en/project/TN01000008" target="_blank" >TN01000008: Center of electron and photonic optics</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2020

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

METAL 2020. 29th International Conference on Metallurgy and Materials. Proceedings

ISBN

978-80-87294-97-0

ISSN

2694-9296

e-ISSN

—

Number of pages

5

Pages from-to

518-522

Publisher name

TANGER

Place of publication

Ostrava

Event location

Brno

Event date

May 20, 2020

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

000794331100082