Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F21%3A00553256" target="_blank" >RIV/68081731:_____/21:00553256 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26620/21:PU142490
Result on the web
<a href="https://ieeexplore.ieee.org/document/9600690" target="_blank" >https://ieeexplore.ieee.org/document/9600690</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/IVNC52431.2021.9600690" target="_blank" >10.1109/IVNC52431.2021.9600690</a>
Alternative languages
Result language
angličtina
Original language name
Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips
Original language description
Murphy-Good plots are the most recent type of the analysis methods in the field electron emission theory, this type of plots has several useful characteristics such as: having the very-nearly straight line to represent the current-voltage characteristics and the absence of the correction factors in the mathematical procedure of the analysis process. In this study, n-type <111> and <100> Si chips containing four individual emitters are used as base emitters and mounted in a diode configuration field emission set-up where the experiments are operated in an ultra-high vacuum (similar to 10(-7) Pa). Each chip has four individual controllable emitters with 5 mu m distance between the Si tips and the same material grid. Laser micromachining and subsequent wet chemical etching technique is used to structure and polish the tips. Murphy-Good plots are used to study the behavior of the Si individual tips and compare the results with the array current by extracting the field emission characterization parameters of the emitters.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2021 34th International Vacuum Nanoelectronics Conference (IVNC)
ISBN
978-1-6654-2589-6
ISSN
2380-6311
e-ISSN
—
Number of pages
2
Pages from-to
(2021)
Publisher name
IEEE
Place of publication
New York
Event location
online
Event date
Jul 5, 2021
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000742045500057