Highly Sensitive Plasmonic Structures Utilizing a Silicon Dioxide Overlayer
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F22%3A00561882" target="_blank" >RIV/68081731:_____/22:00561882 - isvavai.cz</a>
Alternative codes found
RIV/61989100:27240/22:10250602
Result on the web
<a href="https://www.mdpi.com/2079-4991/12/18/3090" target="_blank" >https://www.mdpi.com/2079-4991/12/18/3090</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/nano12183090" target="_blank" >10.3390/nano12183090</a>
Alternative languages
Result language
angličtina
Original language name
Highly Sensitive Plasmonic Structures Utilizing a Silicon Dioxide Overlayer
Original language description
In this paper, simple and highly sensitive plasmonic structures are analyzed theoretically and experimentally. A structure comprising a glass substrate with a gold layer, two adhesion layers of chromium, and a silicon dioxide overlayer is employed in liquid analyte sensing. The sensing properties of two structures with distinct protective layer thicknesses are derived based on a wavelength interrogation method. Spectral reflectance responses in the Kretschmann configuration with a coupling BK7 prism are presented, using the thicknesses of individual layers obtained by a method of spectral ellipsometry. In the measured spectral reflectance, a pronounced dip is resolved, which is strongly red-shifted as the refractive index (RI) of the analyte increases. Consequently, a sensitivity of 15,785 nm per RI unit (RIU) and a figure of merit (FOM) of 37.9 RIU-1 are reached for the silicon dioxide overlayer thickness of 147.5 nm. These results are in agreement with the theoretical ones, confirming that both the sensitivity and FOM can be enhanced using a thicker silicon dioxide overlayer. The designed structures prove to be advantageous as their durable design ensures the repeatability of measurement and extends their employment compared to regularly used structures for aqueous analyte sensing.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
<a href="/en/project/EF17_048%2F0007399" target="_blank" >EF17_048/0007399: New Composite Materials for Environmental Applications</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nanomaterials
ISSN
2079-4991
e-ISSN
2079-4991
Volume of the periodical
12
Issue of the periodical within the volume
18
Country of publishing house
CH - SWITZERLAND
Number of pages
13
Pages from-to
3090
UT code for WoS article
000857073900001
EID of the result in the Scopus database
2-s2.0-85138715666