Field Emission Microscopy as a Tool for Characterizing Scanning Probe Microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F24%3A00618973" target="_blank" >RIV/68081731:_____/24:00618973 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Field Emission Microscopy as a Tool for Characterizing Scanning Probe Microscopy

Original language description

Knápek, A., Burda, D., Allaham, M. M., Košelová, Z., Dupák, L., Sobola, D. Field Emission Microscopy as a Tool for Characterizing Scanning Probe Microscopy. In: Miniworkshop on Surface Science and Field Electron Emission. Niterói: Universidade Federal Fluminens, 2024, s. 5. This talk presented the design and construction of a customized field emission microscope for the analysis of scanning probe microscopy (SPM) probes, namely AFM (atomic force microscopy) and STM (scanning tunneling microscopy).

Czech name

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Czech description

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Type

O - Miscellaneous

CEP classification

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OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

<a href="/en/project/FW03010504" target="_blank" >FW03010504: Development of in-situ techniques for characterization of materials and nanostructures</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů