Noncharging scanning electron microscopy of non-conductors at automatically adjusted critical energies.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F98%3A12980025" target="_blank" >RIV/68081731:_____/98:12980025 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Noncharging scanning electron microscopy of non-conductors at automatically adjusted critical energies.

Original language description

Original scientific paper dealing with Noncharging scanning electron microscopy of non-conductors at automatically adjusted critical energies.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA202%2F96%2F0961" target="_blank" >GA202/96/0961: Verification of the principle of zero - charging high resolution scanning electron microscopy and its applications.</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

1998

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proceedings of the 14th International Congress on Electron Microscopy.

ISBN

0-7503-0568-1

ISSN

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e-ISSN

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Number of pages

2

Pages from-to

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Publisher name

Institute of Physics Publishing Ltd.

Place of publication

Bristol

Event location

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Event date

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Type of event by nationality

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UT code for WoS article

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