X-ray diffraction on Si single crystal with W shaped longitudinal groove
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F00%3A02010258" target="_blank" >RIV/68378271:_____/00:02010258 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
X-ray diffraction on Si single crystal with W shaped longitudinal groove
Original language description
sagittal deviation of diffracted x-ray beam was measured by diffraction on longitudinal wedge
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
<a href="/en/project/PZ-CH%2F22" target="_blank" >PZ-CH/22: Development and production of x-ray optical elements, based on silicon single crystals.</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2000
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Synchrotron Radiation
ISSN
0909-0495
e-ISSN
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Volume of the periodical
2000
Issue of the periodical within the volume
6
Country of publishing house
GB - UNITED KINGDOM
Number of pages
4
Pages from-to
382-385
UT code for WoS article
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EID of the result in the Scopus database
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