Electron probe microanalysis of nonconductive bulk samples.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F00%3A02010319" target="_blank" >RIV/68378271:_____/00:02010319 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Electron probe microanalysis of nonconductive bulk samples.
Original language description
Electron probe x-ray microanalysis of nonconductiv samples can be distorted b electrical field formation under the grounded surface. This posibility is demonstarted by Monte carlo modeling.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2000
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Electron probe microanalysis today practical aspects.
ISBN
80-01-02176-9
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
83-88
Publisher name
Czech Technical University in Prague, Faculty of Mechanical Engineering
Place of publication
Praha
Event location
Třešť [CZ]
Event date
May 17, 2000
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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