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Electron probe microanalysis of nonconductive bulk samples.

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F00%3A02010319" target="_blank" >RIV/68378271:_____/00:02010319 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Electron probe microanalysis of nonconductive bulk samples.

  • Original language description

    Electron probe x-ray microanalysis of nonconductiv samples can be distorted b electrical field formation under the grounded surface. This posibility is demonstarted by Monte carlo modeling.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2000

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Electron probe microanalysis today practical aspects.

  • ISBN

    80-01-02176-9

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    83-88

  • Publisher name

    Czech Technical University in Prague, Faculty of Mechanical Engineering

  • Place of publication

    Praha

  • Event location

    Třešť [CZ]

  • Event date

    May 17, 2000

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article