Ellipsometry and LIMM investigations of the interaction between PZT thin films and platinum electrodes and air.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F01%3A02010275" target="_blank" >RIV/68378271:_____/01:02010275 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Ellipsometry and LIMM investigations of the interaction between PZT thin films and platinum electrodes and air.

Original language description

In this work we present new results of investigation of PbZr 0.235Ti 0.765O 3 (PTZ) films deposited onto Si/SiO 2/adhesion layer/(111) Pt substrate by RF sputtering. Optical constants of PZT films, refraction index depth profile and polarization profilewere determined.

Czech name

—

Czech description

—

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

—

Project

<a href="/en/project/GA202%2F00%2F1425" target="_blank" >GA202/00/1425: Spectroscopy and novel phenomena in complex-doped perovskite-like materials</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2001

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Ferroelectrics

ISSN

0015-0193

e-ISSN

—

Volume of the periodical

254

Issue of the periodical within the volume

N/A

Country of publishing house

GB - UNITED KINGDOM

Number of pages

7

Pages from-to

205-211

UT code for WoS article

—

EID of the result in the Scopus database

—