Optical properties of amorphous and microcrystalline silicon layers.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F01%3A02010316" target="_blank" >RIV/68378271:_____/01:02010316 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Optical properties of amorphous and microcrystalline silicon layers.
Original language description
With the help of optical spectroscopy we can measure(calculate) the optical constants of amorphous silicon (and similarly produced nano/microcrystalline Si).
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F99%2F0403" target="_blank" >GA202/99/0403: CVD diamond films: study of doping and defects</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Properties and Applications of Amourphous Materials.
ISBN
0-7923-6811-8
ISSN
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e-ISSN
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Number of pages
32
Pages from-to
401-432
Publisher name
Kluwer Academic publishers
Place of publication
Dordrecht
Event location
Seč [CZ]
Event date
Jun 25, 2000
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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