Deposition of Er:YAG (YAP) layers by subpicosecond and nanosecond KrF excimer laser ablation.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F02%3A02020295" target="_blank" >RIV/68378271:_____/02:02020295 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Deposition of Er:YAG (YAP) layers by subpicosecond and nanosecond KrF excimer laser ablation.
Original language description
Thin films of Er:YAG and ER:YAP were deposited by picosecond (450fs) and nanosecond (20ns) KrF laser (lambda=248 nm) on YAG, YAP, fused silica, silicon and sapphire substrates.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
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Volume of the periodical
197-198
Issue of the periodical within the volume
N/A
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
5
Pages from-to
416-420
UT code for WoS article
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EID of the result in the Scopus database
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