Computerized evaluation optical measuring thin films by the help of Michelson`s interferometer.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F02%3A02020382" target="_blank" >RIV/68378271:_____/02:02020382 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Computerized evaluation optical measuring thin films by the help of Michelson`s interferometer.
Original language description
The interferometric measurement method of a thin film optical thickness is presented in this report. This measurement is realized by Michelson`s interferometer. Interferogram of a measured sample with one half of the surface covered by a layer is digitally recorded from thr screen by CCD camera.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LN00A015" target="_blank" >LN00A015: Research center for optics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Materials Engineering
ISSN
1335-0803
e-ISSN
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Volume of the periodical
9
Issue of the periodical within the volume
2
Country of publishing house
SK - SLOVAKIA
Number of pages
8
Pages from-to
27-34
UT code for WoS article
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EID of the result in the Scopus database
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