Applicability of magic angle for angle-resolved X-ray photoelectron spectroscopy of corrugated SiO2/Si surfaces: Monte Carlo calculations
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F08%3A00314931" target="_blank" >RIV/68378271:_____/08:00314931 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Applicability of magic angle for angle-resolved X-ray photoelectron spectroscopy of corrugated SiO2/Si surfaces: Monte Carlo calculations
Original language description
Theoretical study of the influence of surface corrugations on the quantitative analysis of layered structures by XPS.
Czech name
Použitelnost magického úhlu ve fotoelektronové spektroskopii drsných povrchů SiO2/Si : Výpočty Monte Carlo]
Czech description
Teoretická studie vlivu povrchové drsnosti na kvantitativní XPS analýzu vrstevnatých struktur.
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F06%2F0459" target="_blank" >GA202/06/0459: Electron interactions at unordered solid surfaces</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface Science
ISSN
0039-6028
e-ISSN
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Volume of the periodical
602
Issue of the periodical within the volume
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Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
6
Pages from-to
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UT code for WoS article
000259062200043
EID of the result in the Scopus database
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