Electrical characterization of locally charged oxidized nanocrystalline diamond films by Kelvin force microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F08%3A00319503" target="_blank" >RIV/68378271:_____/08:00319503 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Electrical characterization of locally charged oxidized nanocrystalline diamond films by Kelvin force microscopy

Original language description

Electrostatically charged micrometer-sized areas are created on a surface of oxygen-terminated nanocrystalline diamond thin film by a tip of atomic force microscope. Those areas are studied by Kelvin probe microscopy and possible charge trapping mechanisms are discussed.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Physica Status Solidi. A

ISSN

1862-6300

e-ISSN

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Volume of the periodical

205

Issue of the periodical within the volume

9

Country of publishing house

DE - GERMANY

Number of pages

5

Pages from-to

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UT code for WoS article

000259653700007

EID of the result in the Scopus database

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