Influence of surface roughness on the measurement uncertainty of white-light interferometry
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F08%3A00340918" target="_blank" >RIV/68378271:_____/08:00340918 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Influence of surface roughness on the measurement uncertainty of white-light interferometry
Original language description
White-light interferometry measuring on rough surface does not resolve the lateral structure of the surface. Consequently the phase of the interferogram becomes a random variable. Therefore in white-light interferometry on rough surface, the phase is notevaluated and the zero path difference is determined by seeking the maximal contrast of the interference fringes. In this way the rough surface gives rise to a measurement error.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
<a href="/en/project/KAN301370701" target="_blank" >KAN301370701: Nanostructured Macroscopic Systems - Technology and Characterisation</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics
ISBN
978-0-8194-7383-7
ISSN
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e-ISSN
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Number of pages
8
Pages from-to
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Publisher name
SPIE - The International Society for Optical Engineering
Place of publication
Bellingham
Event location
Polanica Zdrój
Event date
Sep 8, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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