Detecting sp2 phase on diamond surfaces by atomic force microscopy phase imaging and its effects on surface conductivity

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00328164" target="_blank" >RIV/68378271:_____/09:00328164 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Detecting sp2 phase on diamond surfaces by atomic force microscopy phase imaging and its effects on surface conductivity

Original language description

The effect of deposition parameters and chemical treatment on the surface conductivity of nanocrystalline diamond films was study by atomic force microscopy, XPS, SEM and Raman spectroscopy. The results indicate the decrease in sp2 amount and enhanced surface conductivity of the diamond surface after the chemical treatment.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Diamond and Related Materials

ISSN

0925-9635

e-ISSN

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Volume of the periodical

18

Issue of the periodical within the volume

5-8

Country of publishing house

CH - SWITZERLAND

Number of pages

4

Pages from-to

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UT code for WoS article

000267737000008

EID of the result in the Scopus database

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