Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00336007" target="_blank" >RIV/68378271:_____/09:00336007 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21460/09:00202284
Result on the web
—
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser
Original language description
The beam of Free-Electron Laser in Hamburg (FLASH) tuned at either 32.5 nm or 13.7 nm was focused by a grazing incidence elliptical mirror and an off-axis parabolic mirror coated by Si/Mo multilayer on 20-micron and 1-micron spot, respectively. The grazing incidence and normal incidence focusing of 10-fs pulses carrying an energy of 10 ?J lead at the surface of various solids (Si, Al, Ti, Ta, Si3N4, BN, a-C/Si, Ni/Si, Cr/Si, Rh/Si, Ce:YAG, poly(methyl methacrylate) - PMMA, stainless steel, etc.) to an irradiance of 1013 W/cm2 and 1016 W/cm2, resp. The optical emission of the plasmas produced under these conditions was registered. Surprisingly, only lines belonging to the neutral atoms were observed at intensities around 1013 W/cm2 and 1016 W/cm2, resp.No lines of atomic ions have been identified in UV-vis spectra emitted from the plasmas formed by the FLASH beam focused in a 20-micron spot.
Czech name
—
Czech description
—

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)