Laser-induced damage studies in optical elements using x-ray laser interferometric microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00336016" target="_blank" >RIV/68378271:_____/09:00336016 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Laser-induced damage studies in optical elements using x-ray laser interferometric microscopy

Original language description

Results of a novel X-ray laser application, aimed at understanding the microscopic effects involved in formation of laserinduced damage in optical materials exposed to sub-ns laser pulses, will be presented. Specifically, we studied thin plane beamsplitters that are presently the weakest element of the next generation of high-energy lasers (LMJ, NIF), with permanent damage threshold below 20 J/cm2. Standard fused silica substrates and a model system, containing welldefined micron grooves as seeding sites to trigger damage when irradiated by 438 nm laser pulses, were in situ probed by a neon-like zinc X-ray laser delivering up to 10 mJ at 21.2 nm.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Damage to VUV, EUV, and X-ray Optics II

ISBN

9780819476357

ISSN

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e-ISSN

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Number of pages

11

Pages from-to

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Publisher name

SPIE

Place of publication

Bellingham

Event location

Prague

Event date

Apr 21, 2009

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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