The monitoring and the real-time control of an ultra-thin silver layer growth
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00339879" target="_blank" >RIV/68378271:_____/09:00339879 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
The monitoring and the real-time control of an ultra-thin silver layer growth
Original language description
Silver is one of the most suitable materials for a fabrication of metal-dielectric optical devices due to its unique optical constants. The final performance of such devices significantly depends on a quality of the silver-dielectrics interface. This interface is mainly affected during the initial nucleation of the silver on a substrate. Therefore we focused our attention on a study of this stage of the silver growth. The silver layers were deposited by the magnetron sputtering. The initial stage of thenucleation and the layer growth was studied by means of an optical monitoring, which is based on a principle of spectrophotometric measurement of sample reflectivity. The measured data were fitted to a model including Fresnel coefficients. The non-continual (Volmer-Weber) mode of the layer nucleation was clearly distinguished in the monitored data. The non-continual layer was modeled by means of effective media approximations.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů