Anomalous charge current transport in semi-insulatingGaAs with a new contact metallization: Influence of 2DEG formed at the M-S interface
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F10%3A00349319" target="_blank" >RIV/68378271:_____/10:00349319 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Anomalous charge current transport in semi-insulatingGaAs with a new contact metallization: Influence of 2DEG formed at the M-S interface
Original language description
Radiation detector structures made of semiinsulating GaAs were prepared with a new kind of low-work function metallization. I-V curves were measured in different geometries of both top and bottom contacts. Anomalous decrease of the reverse current observed for Mg and Gd contacts is discussed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F07%2F0525" target="_blank" >GA202/07/0525: Deep defects in semiconductors for optoelectronic applications</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
SURFINT-SREN II
ISBN
978-80-223-2723-7
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
Comenius University
Place of publication
Bratislava
Event location
Florence
Event date
Nov 16, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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