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Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F11%3A00359322" target="_blank" >RIV/68378271:_____/11:00359322 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1364/OE.19.000193" target="_blank" >http://dx.doi.org/10.1364/OE.19.000193</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1364/OE.19.000193" target="_blank" >10.1364/OE.19.000193</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources

  • Original language description

    We investigated the damage mechanism of MoN/SiN multilayer XUV optics under two extreme conditions: thermal annealing and irradiation with single shot intense XUV pulses from the free-electron laser facility in Hamburg - FLASH. The damage was studied "post-mortem" by means of X-ray diffraction, interference-polarizing optical microscopy, atomic force microscopy, and scanning transmission electron microscopy. Although the timescale of the damage processes and the damage threshold temperatures were different (in the case of annealing it was the dissociation temperature of Mo2N and in the case of XUV irradiation it was the melting temperature of MoN) the main damage mechanism is very similar: molecular dissociation and the formation of N-2, leading to bubbles inside the multilayer structure.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Optics Express

  • ISSN

    1094-4087

  • e-ISSN

  • Volume of the periodical

    19

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    13

  • Pages from-to

    193-205

  • UT code for WoS article

    000285915300031

  • EID of the result in the Scopus database