Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F11%3A00364302" target="_blank" >RIV/68378271:_____/11:00364302 - isvavai.cz</a>
Alternative codes found
RIV/61389021:_____/11:00364302
Result on the web
<a href="http://dx.doi.org/10.1063/1.3585871" target="_blank" >http://dx.doi.org/10.1063/1.3585871</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.3585871" target="_blank" >10.1063/1.3585871</a>
Alternative languages
Result language
angličtina
Original language name
Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors
Original language description
Real-time ion diagnostics have been performed by the use of various time-of-flight (TOF) detectors: ion collectors (ICs) with and without absorber thin films, new prototypes of single-crystal diamond and silicon carbide detectors, and an electrostatic ion mass spectrometer (IEA). In order to suppress the long photopeak induced by soft X-rays and to avoid the overlap with the signal from ultrafast particles, the ICs have been shielded with Al foil filters. The application of large-bandgap semiconductor detectors (>3 eV) ensured cutting of the plasma-emitted visible and soft-UV radiation and enhancing the sensitivity to the very fast proton/ion beams. Employing the IEA spectrometer, various ion species and charge states in the expanding laser-plasma havebeen determined.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Applied Physics
ISSN
0021-8979
e-ISSN
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Volume of the periodical
109
Issue of the periodical within the volume
10
Country of publishing house
US - UNITED STATES
Number of pages
8
Pages from-to
"103302/1"-"103302/8"
UT code for WoS article
000292115900043
EID of the result in the Scopus database
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