Variable light biasing method to measure component I-V characteristics of multi-junction solar cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00377804" target="_blank" >RIV/68378271:_____/12:00377804 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.solmat.2012.04.014" target="_blank" >http://dx.doi.org/10.1016/j.solmat.2012.04.014</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.solmat.2012.04.014" target="_blank" >10.1016/j.solmat.2012.04.014</a>
Alternative languages
Result language
angličtina
Original language name
Variable light biasing method to measure component I-V characteristics of multi-junction solar cells
Original language description
We present a new technique to measure component current-voltage (I-V) curves of individual sub-cells integrated in a monolithic multi-junction solar cell. This new approach, compared to all previously reported ones, is well suited for thin-film silicon p-i-n structures where the so-called shifting approximation, which supposes that illumination only shifts the I-V curve without changing its shape, is not valid. Moreover, the proposed method is particularly resistant to problems related to electrical shunts. The principle of this method lies in coupling the level of a selective light bias with the level of measured electrical current in order to fix the voltage of a selected sub-cell while sweeping over the current axis. When one of the sub-cells has afixed voltage, it is then possible to get the I-V characteristics of the second one, shifted by a fixed voltage value. This measurement procedure is simple and requires no modeling.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F09%2F0417" target="_blank" >GA202/09/0417: New non-destructive technique of measurement of I-V curves of monolithic multi-junction solar cells</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Solar Energy Materials and Solar Cells
ISSN
0927-0248
e-ISSN
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Volume of the periodical
103
Issue of the periodical within the volume
8
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
6
Pages from-to
128-133
UT code for WoS article
000306044300020
EID of the result in the Scopus database
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