Investigation of multilayer X-ray optics for 6 keV to 20 keV energy range

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00380741" target="_blank" >RIV/68378271:_____/12:00380741 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1107/S0909049512032153" target="_blank" >http://dx.doi.org/10.1107/S0909049512032153</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S0909049512032153" target="_blank" >10.1107/S0909049512032153</a>

Result language
angličtina
Original language name
Investigation of multilayer X-ray optics for 6 keV to 20 keV energy range
Original language description
The X-ray optics group at the SLS (Swiss Light Source) in co-operation with RIT (Rigaku Innovative Technologies) has investigated seven different multilayer samples. The goal was to find an ideal multilayer structure for the energy range between 6 keV -20 keV in terms of energy resolution and reflectivity. Such multilayer structures deposited on substrates can be used as X-ray monochromators or reflecting synchrotron mirrors. The measured reflectivities agree with the simulated ones. They are coveringa reflectivity range from 45% - 80% for energies between 6 keV - 10 keV and 80% - 90% for energies between 10 keV - 20 keV. The experimentally measured energy resolution of the samples lies between 0.3% - 3.5%.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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