Charged micro-patterns on nanocrystalline diamond are well defined by electrical current application

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00390085" target="_blank" >RIV/68378271:_____/12:00390085 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Charged micro-patterns on nanocrystalline diamond are well defined by electrical current application

Original language description

We apply atomic force microscope for local electrostatic charging of oxygen-terminated nanocrystalline diamond (NCD) thin films deposited on silicon by regulated electrical current application. The NCD films have sub-100 nm thickness and 60% relative sp2phase content. The charge is injected by constant current application. Induced electrical potential contrast is then evaluated by Kelvin Force Microscopy (KFM) which shows welldefined homogeneous features and a sub-linear increase of surface potential with increase in electrical current. We suggest limitation by field-induced detrapping.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2012

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Acta Universitatis Carolinae. Mathematica et Physica

ISSN

0001-7140

e-ISSN

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Volume of the periodical

53

Issue of the periodical within the volume

2

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

7

Pages from-to

61-67

UT code for WoS article

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EID of the result in the Scopus database

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