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Layer-resolved photoelectron diffraction from Si(001) and GaAs(001)

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00390483" target="_blank" >RIV/68378271:_____/12:00390483 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.sciencedirect.com/science/article/pii/S0368204812001326" target="_blank" >http://www.sciencedirect.com/science/article/pii/S0368204812001326</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.elspec.2012.10.007" target="_blank" >10.1016/j.elspec.2012.10.007</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Layer-resolved photoelectron diffraction from Si(001) and GaAs(001)

  • Original language description

    Photoelectron diffraction in the layer-resolved mode brings more detailed information about local atomic arrangement than is obtained in the standard mode. This is demonstrated in crystals with diamond and zinc-blende structures, both for unpolarized photon excitation as well as for circularly polarized excitation. The full angular distributions of photoemission intensities are evaluated for large atomic clusters representing ideally truncated surfaces of Si(001) and GaAs(001). Highly structured layer-resolved patterns enable a more detailed understanding of the standard mode outcomes. Photoelectron intensities from atomic layers placed at different depths under the crystal surface provide direct evidence about electron attenuation and its anisotropy in crystals.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GAP204%2F10%2F0035" target="_blank" >GAP204/10/0035: Hyperfine Interactions in Nanosized and Low-Dimensional Iron Oxides</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Electron Spectroscopy and Related Phenomena

  • ISSN

    0368-2048

  • e-ISSN

  • Volume of the periodical

    185

  • Issue of the periodical within the volume

    11

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    6

  • Pages from-to

    512-517

  • UT code for WoS article

    000314439900012

  • EID of the result in the Scopus database