Electron and hole traps in X-ray irradiated Y2SiO5 and Lu2SiO5 crystals
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F14%3A00432352" target="_blank" >RIV/68378271:_____/14:00432352 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1002/pssb.201350028" target="_blank" >http://dx.doi.org/10.1002/pssb.201350028</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/pssb.201350028" target="_blank" >10.1002/pssb.201350028</a>
Alternative languages
Result language
angličtina
Original language name
Electron and hole traps in X-ray irradiated Y2SiO5 and Lu2SiO5 crystals
Original language description
Characteristics of thermally stimulated luminescence (TSL) are studied for the X-ray irradiated at 4, 80, or 295K nominally undoped Y2SiO5 and Lu2SiO5 single crystals of different origin, containing traps for holes (Ce3+, Tb3+ ions) and electrons (Eu3+,Mo6+ ions), as well as for the Sm3+ -doped Lu2SiO5 crystal.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/GAP204%2F12%2F0805" target="_blank" >GAP204/12/0805: Advanced material solutions for thin film scintillators and light transformers</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physica Status Solidi B-Basic Solid State Physics
ISSN
0370-1972
e-ISSN
—
Volume of the periodical
251
Issue of the periodical within the volume
4
Country of publishing house
DE - GERMANY
Number of pages
7
Pages from-to
741-747
UT code for WoS article
000334841500003
EID of the result in the Scopus database
—