Surface structure and electronic states of epitaxial ?-FeSi2(100)/Si(001) thin films: Combined quantitative LEED, ab initio DFT, and STM study
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F14%3A00436120" target="_blank" >RIV/68378271:_____/14:00436120 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1103/PhysRevB.90.155305" target="_blank" >http://dx.doi.org/10.1103/PhysRevB.90.155305</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1103/PhysRevB.90.155305" target="_blank" >10.1103/PhysRevB.90.155305</a>
Alternative languages
Result language
angličtina
Original language name
Surface structure and electronic states of epitaxial ?-FeSi2(100)/Si(001) thin films: Combined quantitative LEED, ab initio DFT, and STM study
Original language description
The surface structure of epitaxial ?-FeSi2(100) thin film grown on Si(001) was analyzed using the quantitative low-energy electron diffraction intensity-voltage (LEED I-V) method, ab initio density functional theory (DFT) calculations, and scanning tunneling microscopy (STM). The iron-silicide film truncation and atomic surface structure were determined by LEED I-V method. Significant atomic relaxations within the topmost surface layers were revealed by the LEED I-V method and confirmed by DFT. The simulated STM patterns from the best-fit model agree well with the measured STM images on the ?-FeSi2(100)/Si(001)-p(2 2) surface. Electronic band structure analysis of the bulk and epitaxial ?-FeSi2(100) was carried out. Surface electronic states were identified by a partial k-resolved atomic-orbital based local density-of-state analysis.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physical Review. B
ISSN
1098-0121
e-ISSN
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Volume of the periodical
90
Issue of the periodical within the volume
15
Country of publishing house
US - UNITED STATES
Number of pages
9
Pages from-to
"155305-1"-"155305-9"
UT code for WoS article
000343771700002
EID of the result in the Scopus database
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