Review of the phenomenon of dips in spectral lines emitted from plasmas and their applications

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F14%3A00487469" target="_blank" >RIV/68378271:_____/14:00487469 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1088/1742-6596/548/1/012030" target="_blank" >http://dx.doi.org/10.1088/1742-6596/548/1/012030</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1742-6596/548/1/012030" target="_blank" >10.1088/1742-6596/548/1/012030</a>

Result language
angličtina
Original language name
Review of the phenomenon of dips in spectral lines emitted from plasmas and their applications
Original language description
The review covers theoretical and experimental studies of two kinds of dips (local depressions) in spectral line profiles emitted by plasmas: Langmuir-wave-caused dips (L-dips) and charge-exchange-caused dips (X-dips). Positions of L-dips (relative to the unperturbed wavelength of a spectral line) scale with the electron density Ne roughly as Ne1/2, while positions of X-dips are almost independent of Ne. L-dips and X-dips phenomena are interesting and important both fundamentally and practically. The fundamental interest is due to a rich physics behind each of these phenomena. As for important practical applications, they are as follows. Observation of L-dips constitutes a very accurate method to measure the electron density in plasmas – the method that does not require the knowledge of the electron temperature. L-dips also allow measuring the amplitude of the electric field of Langmuir waves.n
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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