Simultaneous nc-AFM/STM measurements with atomic resolution
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00456646" target="_blank" >RIV/68378271:_____/15:00456646 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1007/978-3-319-15588-3_3" target="_blank" >http://dx.doi.org/10.1007/978-3-319-15588-3_3</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/978-3-319-15588-3_3" target="_blank" >10.1007/978-3-319-15588-3_3</a>
Alternative languages
Result language
angličtina
Original language name
Simultaneous nc-AFM/STM measurements with atomic resolution
Original language description
We discuss the history and recent progress of simultaneous AFM/STM measurements with atomic resolution. We demonstrate, that the technique can provide complex information about chemical and physical processes at atomic scale as well as about material properties of surfaces and nanostructures. We briefly overview one of the most fascinating achievements, high-resolution imaging with functionalized tips.
Czech name
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Czech description
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Classification
Type
C - Chapter in a specialist book
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA14-02079S" target="_blank" >GA14-02079S: Control of single electron charge states in molecules on surfaces</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Book/collection name
Noncontact Atomic Force Microscopy
ISBN
978-3-319-15587-6
Number of pages of the result
21
Pages from-to
29-49
Number of pages of the book
527
Publisher name
Springer International Publishing
Place of publication
Cham
UT code for WoS chapter
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