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Simultaneous nc-AFM/STM measurements with atomic resolution

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00456646" target="_blank" >RIV/68378271:_____/15:00456646 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1007/978-3-319-15588-3_3" target="_blank" >http://dx.doi.org/10.1007/978-3-319-15588-3_3</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1007/978-3-319-15588-3_3" target="_blank" >10.1007/978-3-319-15588-3_3</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Simultaneous nc-AFM/STM measurements with atomic resolution

  • Original language description

    We discuss the history and recent progress of simultaneous AFM/STM measurements with atomic resolution. We demonstrate, that the technique can provide complex information about chemical and physical processes at atomic scale as well as about material properties of surfaces and nanostructures. We briefly overview one of the most fascinating achievements, high-resolution imaging with functionalized tips.

  • Czech name

  • Czech description

Classification

  • Type

    C - Chapter in a specialist book

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA14-02079S" target="_blank" >GA14-02079S: Control of single electron charge states in molecules on surfaces</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Book/collection name

    Noncontact Atomic Force Microscopy

  • ISBN

    978-3-319-15587-6

  • Number of pages of the result

    21

  • Pages from-to

    29-49

  • Number of pages of the book

    527

  • Publisher name

    Springer International Publishing

  • Place of publication

    Cham

  • UT code for WoS chapter