Transient changes of optical properties in semiconductors in response to femtosecond laser pulses
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F16%3A00468766" target="_blank" >RIV/68378271:_____/16:00468766 - isvavai.cz</a>
Alternative codes found
RIV/61389021:_____/16:00509326
Result on the web
<a href="http://dx.doi.org/10.3390/app6090238" target="_blank" >http://dx.doi.org/10.3390/app6090238</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/app6090238" target="_blank" >10.3390/app6090238</a>
Alternative languages
Result language
angličtina
Original language name
Transient changes of optical properties in semiconductors in response to femtosecond laser pulses
Original language description
We present an overview of our theoretical simulations on the interaction of ultrafast laser pulses with matter. Our dedicated simulation tool, X-ray induced Thermal And Non-thermal Transitions (XTANT) can currently treat semiconductors irradiated with soft to hard X-ray fs pulses. During the excitation and relaxation of solids, their optical properties such as reflectivity, transmission and absorption, are changing, affected by transient electron excitation and, at sufficiently high dose, by atomic relocations. We report how the transient optical properties can be used for diagnostics of electronic and structural transitions occurring in irradiated semiconductors. The presented methodology for calculation of the complex dielectric function applied in XTANT proves to be capable of describing changes in the optical parameters, when the solids are driven out of equilibrium by intense laser pulses. Comparison of model predictions with the existing experimental data shows a good agreement.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Sciences-Basel
ISSN
2076-3417
e-ISSN
—
Volume of the periodical
6
Issue of the periodical within the volume
9
Country of publishing house
CH - SWITZERLAND
Number of pages
12
Pages from-to
—
UT code for WoS article
000385518000006
EID of the result in the Scopus database
2-s2.0-84991112220