Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I
Result description
This paper reports computer simulations of the transmitted-beam intensity distribution for the case of six-beam (000, 220, 242, 044,224,202) diffraction of X-rays in a perfect silicon crystal of thickness 1 mm. Both the plane-wave angular dependence and the six-beam section topographs, which are usually obtained in experiments with a restricted beam (two-dimensional slit), are calculated. The angular dependence is calculated in accordance with Ewald's theory. The section topographs are calculated from the angular dependence by means of the fast Fourier transformation procedure. This approach allows one to consider, for the first time, the transformation of the topograph's structure due to the two-dimensional slit sizes and the distance between the slit and the detector. The results are in good agreement with the results of other works and with the experimental data.
Keywords
X-ray diffractionsilicon crystalsix-beam diffractionsection topographycomputer simulations
The result's identifiers
Result code in IS VaVaI
Result on the web
DOI - Digital Object Identifier
Alternative languages
Result language
angličtina
Original language name
Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I
Original language description
This paper reports computer simulations of the transmitted-beam intensity distribution for the case of six-beam (000, 220, 242, 044,224,202) diffraction of X-rays in a perfect silicon crystal of thickness 1 mm. Both the plane-wave angular dependence and the six-beam section topographs, which are usually obtained in experiments with a restricted beam (two-dimensional slit), are calculated. The angular dependence is calculated in accordance with Ewald's theory. The section topographs are calculated from the angular dependence by means of the fast Fourier transformation procedure. This approach allows one to consider, for the first time, the transformation of the topograph's structure due to the two-dimensional slit sizes and the distance between the slit and the detector. The results are in good agreement with the results of other works and with the experimental data.
Czech name
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Czech description
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Classification
Type
Jimp - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Acta Crystallographica A-Foundation and Advances
ISSN
2053-2733
e-ISSN
—
Volume of the periodical
72
Issue of the periodical within the volume
May
Country of publishing house
GB - UNITED KINGDOM
Number of pages
8
Pages from-to
349-356
UT code for WoS article
000375147400009
EID of the result in the Scopus database
2-s2.0-84965057155
Result type
Jimp - Article in a specialist periodical, which is included in the Web of Science database
OECD FORD
Fluids and plasma physics (including surface physics)
Year of implementation
2016