Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F16%3A00488135" target="_blank" >RIV/68378271:_____/16:00488135 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1107/S2053273316001959" target="_blank" >http://dx.doi.org/10.1107/S2053273316001959</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1107/S2053273316001959" target="_blank" >10.1107/S2053273316001959</a>

Result language

angličtina

Original language name

Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I

Original language description

This paper reports computer simulations of the transmitted-beam intensity distribution for the case of six-beam (000, 220, 242, 044,224,202) diffraction of X-rays in a perfect silicon crystal of thickness 1 mm. Both the plane-wave angular dependence and the six-beam section topographs, which are usually obtained in experiments with a restricted beam (two-dimensional slit), are calculated. The angular dependence is calculated in accordance with Ewald's theory. The section topographs are calculated from the angular dependence by means of the fast Fourier transformation procedure. This approach allows one to consider, for the first time, the transformation of the topograph's structure due to the two-dimensional slit sizes and the distance between the slit and the detector. The results are in good agreement with the results of other works and with the experimental data.

Czech name

—

Czech description

—

Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10305 - Fluids and plasma physics (including surface physics)

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2016

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Acta Crystallographica A-Foundation and Advances

ISSN

2053-2733

e-ISSN

—

Volume of the periodical

72

Issue of the periodical within the volume

May

Country of publishing house

GB - UNITED KINGDOM

Number of pages

8

Pages from-to

349-356

UT code for WoS article

000375147400009

EID of the result in the Scopus database

2-s2.0-84965057155