Optical NIR-VIS-VUV constants of advanced substrates for thin-film devices
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F17%3A00479805" target="_blank" >RIV/68378271:_____/17:00479805 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21340/17:00317031
Result on the web
<a href="http://dx.doi.org/10.1364/OME.7.003844" target="_blank" >http://dx.doi.org/10.1364/OME.7.003844</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/OME.7.003844" target="_blank" >10.1364/OME.7.003844</a>
Alternative languages
Result language
angličtina
Original language name
Optical NIR-VIS-VUV constants of advanced substrates for thin-film devices
Original language description
The optical properties of several commonly used single-crystal oxide substrates were explored by spectroscopic ellipsometry over a wide spectral range from 0.74 eV to 8.8 eV. The crystals examined are (100) SrTiO3, 0.7 % wt Nb-doped (100) SrTiO3,(100) (LaAlO3)0,29(SrAl0,5Ta0,5O3)0,7, (011) DyScO3, (100) MgAl2O4, (100) MgO, and (100) LaAlO3, all of which enable epitaxial growth of numerous perovskite-type and other optical thin films. An analytic form for the complex dielectric function was derived from ellipsometric data through a physically consistent modeling process. The obtained dielectric spectra were further utilized to calculate the complex index of refraction and absorption coefficient for each substrate material. The absorption spectra and optical band gap were analyzed using Tauc plots. The parameters for reconstructing the dielectric functions are given in detail, allowing for extensive applications of the results of this work.n
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Optical Materials Express
ISSN
2159-3930
e-ISSN
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Volume of the periodical
7
Issue of the periodical within the volume
11
Country of publishing house
US - UNITED STATES
Number of pages
19
Pages from-to
3844-3862
UT code for WoS article
000414248700006
EID of the result in the Scopus database
2-s2.0-85031403034